Alessandro Padovani

Learn More
In this paper, we investigate the characteristics of the defects responsible for the leakage current in the SiO<sub>2</sub> and SiO<sub>2</sub>/HfO<sub>2</sub> gate dielectric stacks in a wide(More)
BACKGROUND Individuals who have Mild Cognitive Impairment (MCI) may be in a transitional stage between aging and Alzheimer's disease (AD). The high rate of conversion from MCI to AD makes early(More)