Alan Sandborg

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A new windowless X-ray energy-dispersive spectroscopy (XEDS) detector has been developed for an analytical electron microscope (AEM). Different from the conventional XEDS detectors, the new detector does not contain an ultra-thin window (UTW) and a vacuum gate valve which are the major causes of low X-ray detection sensitivity and vibration problems for AEM(More)
The quality of X-ray spectra from FEGTEMs has been improved by three different means: the use of beryllium shields, improved collimation and improved specimen holder geometry. The improvements lead to a significant increase in peak-to-background ratios and a reduction in spurious peaks in the EDX spectra. A double-tilt, low-background specimen holder was(More)
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