Ai-Ping Xian

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Tin whisker growth is a serious reliability concern for electronics using high-density packaging. Whisker growth behavior of tin lead eutectic solders doped with different neodymium concentration (5–0.1wt.%) was studied in present work. Results indicate that the Nd in the all of the Sn–Pb–Nd alloys mainly exists in NdSn3 intermetallic compound, and that the(More)
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