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- Ahmed Abou-Auf, Mostafa M. Abdel-Aziz, Mai A. Elkady, Adel Ammar
- 2016 16th European Conference on Radiation andâ€¦
- 2016

We introduce a novel methodology for identifying the worst-case test vector for flash-based FPGA devices exposed to total ionizing dose based on cell-level fault models of delay failures.

- Ahmed Abou-Auf, H. A. Abdel-Aziz, A. G. Wassal
- IEEE Transactions on Nuclear Science
- 2011

We developed a cell-level fault model for logic failure induced in standard-cell ASIC devices exposed to total ionizing dose. This fault model is valid for CMOS process technologies that exhibitâ€¦ (More)

- Ahmed Abou-Auf
- 2009 National Radio Science Conference
- 2009

We developed a methodology for identifying worst-case test vectors for leakage current failure induced in combinational circuits of cell-based ASICs induced by total-dose. This methodology isâ€¦ (More)

- Ahmed Abou-Auf, Mostafa M. Abdel-Aziz, Hamzah Abdel-Aziz, Amr G. Wassal
- IEEE Transactions on Nuclear Science
- 2012

We introduce a novel methodology for identifying worst-case test vectors for sequential circuits in ASIC devices exposed to total dose. Testing of sequential circuits requires the use of sequence ofâ€¦ (More)

- Ehab S. Awad, Theodora Rezk, Ahmed Abou-Auf
- 2013 8th IEEE Design and Test Symposium
- 2013

We present theoretical model of interdigitated MSM photo-detector and RF electro-optic self-mixer based on standard CMOS technology. The model allows for simulation and analysis of photodetectionâ€¦ (More)

- Ahmed Abou-Auf, Hamzah Abdel-Aziz, Mostafa M. Abdel-Aziz
- 2009 European Conference on Radiation and Itsâ€¦
- 2009

We developed a methodology for identifying worst-case test vectors for logic faults induced in combinational circuits of cell-based ASICs induced by total dose. This methodology is independent of theâ€¦ (More)

- Ahmed Abou-Auf, H. A. Abdel-Aziz, M. M. Abdel-Aziz
- IEEE Transactions on Nuclear Science
- 2010

We developed a methodology for identifying worst-case test vectors for logic faults induced by total dose in combinational circuits of cell-based ASICs. This methodology is independent of the designâ€¦ (More)

- Ahmed Abou-Auf, Mostafa M. Abdel-Aziz, Hamzah Abdel-Aziz, Amr G. Wassal
- 2011 12th European Conference on Radiation andâ€¦
- 2011

We introduce a novel methodology for identifying worst-case test vectors for sequential circuits in ASIC devices exposed to total dose. Testing of sequential circuits requires the use of sequence ofâ€¦ (More)

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