Adrian B. Johnston

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Semiconductor Industry: one of the most technologically advanced manufacturing sectors Wafer sizes are growing ⇒ Process Quality and Control of increasing importance Virtual Metrology (VM) systems: models of the process based on tool variables used to predict product parameters that are costly (time & money) to measure directly
large scale constraint satisfaction and scheduling problems using a heuristic repair method. A new method for solving hard satissa-bility problems. 34 We then demonstrated that when the network is restricted to trees a uniform, self-stabilizing protocol exists for solving the problem with any central scheduler, where only one neighboring node is activated(More)
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