Adithya Thaduri

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Traditional approaches like MIL-HDBK, Telcordia, and PRISM etc. have limitation in accurately predicting the reliability due to advancement in technology, process, materials etc. As predicting the reliability is the major concern in the field of electronics, physics of failure approach gained considerable importance as it involves investigating the(More)
In this paper, it was discussed on the several reliability prediction models for electronic components and comparison of these methods was also illustrated. A combined methodology for comparing the cost incurring for prediction was designed and implemented with an instrumentation amplifier and a BJT transistor. By using the physics of failure approach, the(More)
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