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We study the electro optical properties of a Metal-Nitride-Oxide-Silicon (MNOS) stack for a use in CMOS compatible plasmonic active devices. We show that the insertion of an ultrathin stoichiometric Si(3)N(4) layer in a MOS stack lead to an increase in the electrical reliability of a copper gate MNOS capacitance from 50 to 95% thanks to a diffusion barrier(More)
We report on the observation of broad photoluminescence wavelength tunability from n-type gallium nitride nanoparticles (GaN NPs) fabricated using the ultraviolet metal-assisted electroless etching method. Transmission and scanning electron microscopy measurements performed on the nanoparticles revealed large size dispersion ranging from 10 to 100 nm.(More)
This study examined the effects of light, temperature and carbon dioxide on the growth of potato (Solanum tuberosum L.) in a controlled environment in order to ascertain the best growing conditions for potato in life support systems in space. 'Norland' and 'Russet Burbank' were grown in 6-L pots of peat-vermiculite for 56 d in growth chambers at the(More)
Polycrystalline Er-Sc silicates (Er(x)Sc(2-x)SiO₅ and Er(x)Sc(2-x)Si₂O₇) were fabricated using multilayer nanostructured films of Er₂O₃/SiO₂/Sc₂O₃ deposited on SiO₂/Si substrates by RF- sputtering and thermal annealing at high temperature. RBS, TEM, GIXD, and PL results show the presence of Er(x)Sc(2-x)SiO₅ with an emission peak at 1528 nm for annealing(More)
Polycrystalline Er<sub>x</sub>Sc<sub>2-x</sub>Si<sub>2</sub>O<sub>7</sub> compounds were fabricated using RF-sputtering by alternating Er<sub>2</sub>O<sub>3</sub>, Sc<sub>2</sub>O<sub>3</sub> layers separated by SiO<sub>2</sub> layer. This new compounds presents excitation cross section at 980nm around 1.39&#x00D7;10<sup>-21</sup>cm<sup>2</sup> with(More)
Polycrystalline Er-Sc silicates (Er x Sc2-x Si2O7 and Er x Sc2-x SiO5) were fabricated using multilayer nanostructured films of Er2O3/SiO2/Sc2O3 deposited on SiO2/Si substrates by RF sputtering and thermal annealing at high temperature. The films were characterized by synchrotron radiation grazing incidence X-ray diffraction, cross-sectional transmission(More)
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