Abilio Parreira

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This paper presents a fault simulation algorithm that uses efficient partial reconfiguration of FPGAs. The methodology is particularly useful for evaluation of BIST effectiveness, and for applications in which multiple fault injection is mandatory, such as safety-critical applications. A novel fault collapsing methodology is proposed, which efficiently(More)
This paper addresses the problem of test quality assessment, namely of BIST solutions, implemented in FPGA and/or in ASIC, through Hardware Fault Emulation (HFE). A novel HFE methodology and tool is proposed, that, using partial reconfiguration, efficiently measures the quality of the BIST solution. The proposed HFE methodology uses Look-Up Tables (LUTs)(More)
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