Abdul Rauf Khan

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Extensive use of machines, flexible/re-configurable manufacturing and transition towards the fully automated factories call for intelligent use of information recorded during the manufacturing process. Modern manufacturing processes produce Terabytes of information during different stages of the process e.g sensor measurements, machine readings etc, and the(More)
In this paper, we present Carrier Interferometry (CI) spread OFDMA system with orthogonal subcarrier grouping (CI/GO-OFDMA) to support variable rate user classes. This work highlights the application of CI codes which can be generated for any integer to ensure efficient multicarrier variable rate transmission scheme. Simulation results obtained over(More)
Channel length of a top contact Organic Thin Film Transistor (OTFT) is usually defined during its fabrication by optical lithography or shadow masking during metal deposition process. Realizing short channel (sub-ten micron channel length) transistors by lithography requires costly equipments. On the other hand, it is extremely challenging to achieve short(More)
The channel lengths of the top contact organic thin film transistors are usually defined during their fabrication by optical lithography or by shadow masking during the metal deposition process. Realizing short channel (sub-ten micron channel length) transistors by lithography will require costly lithography equipment. On the other hand, it is extremely(More)
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