• Publications
  • Influence
METROLOGIA ÓPTICA, IN SITU E PÓS-DEPOSIÇÃO, DE FILMES INOMOGÊNEOS DE ZnS
In the process of thermal vacuum deposition of ZnS optical films, we developed a metrological procedure involving intercomparisons amog resuts obtained from "in situ" Optical (OM) and Quartz CristalExpand