A. R. Sandy

Learn More
—X-ray photon correlation spectroscopy (XPCS) is a unique tool to study the dynamical properties in a wide range of materials over a wide spatial and temporal range. XPCS measures the correlated changes in the speckle pattern, produced when a coherent x-ray beam is scattered from a disordered sample, over a time series of area detector images. The technique(More)
The newly introduced coherence-based technique of X-ray near-field speckle (XNFS) has been implemented at 8-ID-I at the Advanced Photon Source. In the near-field regime of high-brilliance synchrotron X-rays scattered from a sample of interest, it turns out that, when the scattered radiation and the main beam both impinge upon an X-ray area detector, the(More)
  • 1