A. D. Tatarnikov

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Test program generation plays a major role in functional verification of microprocessors. Due to tremendous growth in complexity of modern designs and rigid constraints on time to market, it becomes an increasingly difficult task. In spite of powerful test program generators available in the market, development of functional tests is still known to be the(More)
Development of test programs and analysis of the results of their execution is the basic approach to verification of microprocessors at the system level. There is a variety of methods for the automation of test generation, starting with the generation of random code and ending with directed model-based test generation. However, there is no cure-all method.(More)
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